{pdf} Scanning Probe Microscopy-Physical Property Characterization at Nanoscale Nalladega V. (Ed.)

InTech, 2012. – 253 p. – This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, to oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. Scanning probe microscopy (SPM) is one the key enabling tools for the advancement of nanotechnology, with applications in many interdisciplinary research areas. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.Contents.
Instrumentation Development.
Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy.
Tuning Fork Scanning Probe Microscopes – Applications for the Nano-Analysis of the Material Surface and Local Physico-Mechanical Properties.
Surface Morphology.
Statistical Analysis in Homopolymeric Surfaces.
Polyamide-lmide Membranes of Various Morphology – Features of Nano-Scale Elements of Structure.
Characterization of Complex Spintronic and Superconducting Structures by Atomic Force Microscopy Techniques.
Influence of Thickness on Structural and Optical Properties of Titanium Oxide Thin Layers.
Characterization of Mechanical Properties.
Microtribological Behavior of Polymer-Nanoparticle Thin Film with AFM.
Nanomechanical Evaluation of Ultrathin Lubricant Films on Magnetic Disks by Atomic Force Microscopy.
Estimation of Grain Boundary Sliding During Ambient-Temperature Creep in Hexagonal Close-Packed Metals Using Atomic Force Microscope.
Elastic and Nanowearing Properties of Si02-PMMA and Hybrid Coatings Evaluated by Atomic Force Acoustic Microscopy and Nanoindentation.